THERMO SCIENTIFIC Thermo arl Advant'X WDXRF x-ray fluorescent spectrometer Spectrophotometer

ARL ADVANT’X IntelliPower

Sequential X-Ray Fluorescence Spectrometers

Advances in X-ray fluorescence
analysis
The Thermo Scientific ARL ADVANT'X
IntelliPower family of X-ray fluorescence
(XRF) sequential spectrometers with
IntelliPower technology provides the choice
of performance and value to suit your true
requirements. These high tech instruments
allow analysis of up to 84 elements of the
periodic table in conductive or non-
conductive solids or liquids. Many
application areas will find their perfect
match within this new family of
instruments, notably:
• Monitoring of trace elements in oils
or polymers
• Analysis of major and minor elements in
cement and quarry materials
• Full analysis of glasses, metals, ores,
refractories and geological materials
Advantages over other analytical
techniques are:
• Easy sample preparation
• Speed of analysis
• High stability
• Good precision
• Wide dynamic range (from ppm levels
to 100 %)
• Simple and rapid analysis of totally
unknown samples thanks to state-of-
the-art standard-less analysis packages,
i.e. QuantAS™, UniQuant® and OptiQuant™
IntelliPower technology
Thanks to a clever management of power,
the ARL ADVANT’X IntelliPower
spectrometers can operate at 1200 W and
even 2500 W without requiring external
water cooling. Therefore neither tap water,
nor a water cooler is required in these
cases. At higher power levels (3.6 kW or
4.2 kW), energy savings and reduced
stress on the X-ray tube are obtained
thanks to intelligent management of the
X-ray tube power.
Unique Moiré fringe goniometers
At the heart of the ARL ADVANT’X Series
XRF spectrometers, the exclusive Moiré
fringe goniometers will ensure reliable and
fast angular positioning of crystals and
detectors. Their ingenious friction-free
positioning system guarantees speed,
flexibility and reliability of analysis.
Accurate angular positions are
achieved thanks to electro-optical readers
counting Moiré fringes resulting from the
interference of two grating systems. This
«no gear» design brings several important
advantages:
• Up to 4800 ˚/min slewing speed which is
5 times faster than a conventional
goniometer
• The absence of friction means no wear
with time, which assures an excellent
angular reproducibility (< ± 0.0002 ˚)
• High accuracy of peak positions, e.g.
0.015 ˚ with LiF crystal, such that peaks
are found at theoretical angles. This is
up to 8 times better than on conventional
systems
• Alignment of the crystal and detector
θ/2θ relationship is performed
automatically by the microprocessor.
Unlike conventional systems, no
mechanical adjustments are needed
Microprocessors working in multitasking
mode ensure fast positioning of the crystals,
collimators and detectors. In addition, the
entire goniometer is under constant
temperature control in the vacuum chamber
to ensure long-term stability. Furthermore, as
crystals are the most sensitive to
temperature changes, they are themselves
thermostatically controlled to ± 0.1 c