NIDEK OPD II Topographer

The NIDEK OPD-Scan II provides information on corneal topography, wavefront, autorefraction, keratometry, and pupillometry in one unit, utilizing state-of-the-art imaging and analysis technology developed specifically to measure normal to highly aberrated eyes.nThe system offers a variety of data maps to provide information on the total refractive error, wavefront, corneal shape, internal aberrations, and visual quality of the eye; allowing highly accurate and reliable information for optic diagnostics.nnThe OPD-Scan II utilizes the principle of skiascopic phase difference for refractive error map measurement. The retina is scanned with an infrared light slit beam, and the reflected light is captured by an array of rotating photo detectors over a 360º area.The corneal topography function utilizes Placido disc technology.nnThe system captures the image of reflected rings of light from the cornea and analyzes thousands of data points to plot the corneal contour, shape, and refractive power.The OPD-Scan II measures corneal refractive power by corneal topography, and total refractive error as the OPD map.nnThe Internal OPD Map plot is created by subtracting the corneal refractive power from the total OPD to display in diopters the distribution of refractive error contained in the internal eye.nnSpecificationsn-Spherical Power Range: - 20.00 to + 22.00 Dn-Cylindrical Power: 0.00 to ±12.00 Dn-Axis: 0 to 180n-Measuring Area: 2.0 to 6.0 mm diameter (4 zone measurement)n-Measuring Points: 1,440 points (4 x 360)n-Measuring Time: < 0.4 secondsn-Measuring Method: Automated Objective Refraction (Dynamic skiascopy)n-Mapping Methods: OPD, Internal OPD, Wavefront Maps, Zernike Graph, PSFCorneal Topography Functionn-Measuring Rings: 19 Vertical, 23 Horizontaln-Measuring Area: 0.5 to 11.0 mm dia. (r=7.9)n-Dioptric Range: 10 to 100 Dn-Axis Range: 0 to 359n-Measuring Points: More than 6,800n-Mapping Methods: Axial, Instantaneous, Refractive, Elevation